Photovoltaics, Semiconductors and Thin Film Applications

Thin films are used in many applications including semiconductors, photovoltaic devices, mirrors, anti-reflection coatings, and filters. It is often crucial for one to know the thickness, reflectivity, homogeneity, or refractive index of the film to ensure that it is optimized for its purpose. Spectroscopy can be used to measure these parameters if one understands the interaction between the film and light. The experts at Middleton Research can provide laboratory services and hyperspectral analysis for film sample measurements or customized spectral equipment and software for your unique application.

Please see the brochures below or contact us for further information.

Product Sheets

Hyperspectral Thin Film Measurement System

Hyperspectral Prediction Engine™

Application Notes

Monitoring of Continuous Manufacturing

High Speed Hyperspectral Chemical Imaging (Technical Paper)